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Using IC-CAP with an Agilent 85123A Device Modeling System
This appendix documents procedures for setup, calibration, and control of the Agilent 85123A RF parameter extraction test system. Some of these are hardware procedures independent of IC-CAP, and some are hardware control procedures performed inside IC-CAP.
These procedures are common among the high-frequency IC-CAP models. This is not a sequential set of procedures, but a set of separate hardware-related procedures used in conjunction with any of the device modeling procedures documented in the modeling chapters. Use the information in this appendix when you are directed here, at the appropriate times in the modeling procedures.
The procedures in this appendix give detailed instructions for the following:
| • | Configuring the system hardware |
| • | Performing hardware setup in IC-CAP |
| • | Defining the instrument states in IC-CAP (for DC, capacitance, and S-parameter measurements) |
| • | Calibrating the network analyzer |
The instructions explain when the hardware-related procedures are needed and when they are not. In some cases, you may not need to perform all these procedures each time you model a device. The system setup procedures are performed rarely. Setting the instrument states is done for each measurement setup in each model, and the settings can be stored for repeated use. The network analyzer calibration must be performed regularly for accuracy.