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| GETTING STARTED | ||||
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| What's New Highlights (on the Web) of what is new in IC-CAP. |
Release Notes Latest information for the current release of IC-CAP. |
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| DOCUMENTATION | ||||
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Installation Windows and UNIX installation, configuration, troubleshooting, and licensing information. |
User's Guide Creating models, macros, and graphic user interfaces, making measurements, and using transforms and functions. Includes information on simulating, optimizing, programming, managing data, printing and plotting. |
Reference Supported instruments, drivers, simulators, IC-CAP functions, Parameter Extraction Language (PEL), variables, and file structure. |
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Nonlinear Device Models, Volume 1 Characterization for the following models: HiSIM_HV, HiSIM2, PSP, BSIM4, BSIM3v3, MOS Model 9, UCB MOSFET, Agilent HBT, UCB bipolar transistor, , UCB GaAs MESFET, and Curtice GaAs MESFET. In addition, using circuit modeling and the 1/f noise extraction toolkit. |
Nonlinear Device Models, Volume 2 Using the following models: Agilent Root FET, High-Frequency FET (Curtice), High-Frequency BJT (Gummel-Poon), Agilent Root MOSFET, Agilent Root Diode, Agilent EEFET3/EEHEMT1, Agilent EEBJT2, Mextram, and VBIC. In addition, using IC-CAP with microwave and RF parameter extraction test systems. |
Target Modeling Using the Target Modeling toolkit. Includes information on adding your own simulation template. |
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Statistical Analysis Using the IC-CAP Statistics package. Includes information on data analysis, data visualization, and file formats. |
PDFs Links to printable PDF files for all IC-CAP documentation. |
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| RESOURCES | ||||
| Articles Links (on the Web) to journal articles on Agilent EEsof EDA products and applications. |
Knowledge Center Links (on the Web) to discussion forums, examples, software downloads, support documents, and tech info sessions. |
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