High-Frequency FET (Curtice) Models

This chapter documents the Agilent 85192A high-frequency FET modeling software which includes three models:

While these models are well known for use with DC and low-frequency devices, the extraction methodology used here is specific to high-frequency devices. The measurement and extraction software and procedures have been developed to ensure accurate modeling results that are constant, rather than a function of frequency.

The example procedures here focus on the Curtice cubic model. Some differences between the Curtice cubic and Curtice quadratic models are documented in the IC-CAP Reference manual.

The software performs a series of DC and S-parameter measurements, based on predefined measurement configurations and on variables you define during the procedures. The measured values are then used to extract individual device parameters, through software conversion of the S-parameters to admittance or impedance parameters. The resulting model can be used to simulate the performance of any similar device in a circuit under design. Its data files can be read directly into datasets in the Agilent RF and Microwave Design System (MDS). The model can also be used as a standard for quantitative performance measures in process and material control.