Manuals >Nonlinear Device Models Volume 1 >BSIM3v3 Characterization Print version of this Book (PDF file) |
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Temperature DependencePlease use the model bsim3_tutor_temp.mdl provided with the BSIM3v3 Modeling Package to visualize the temperature model parameters. Load the file into IC-CAP and run the different macros to see how certain parameters affect the device behavior of a deep submicron MOS transistor. Built-in Temperature DependenciesThe BSIM3v3 model uses some physically based built-in temperature dependencies as listed below: Intrinsic carrier concentration:
Unfortunately, the surface potential Temperature EffectsIn addition to the built-in temperature dependencies, the following temperature related effects are modeled in BSIM3. They are related to threshold voltage, mobility, saturation of carrier velocity, drain-source resistance, and the saturation current of the drain/source bulk diodes. The behavior of the threshold voltage for a large and a short device is shown in tThe following figure.
b) Carrier MobilityAll four model parameters of the carrier mobility are implemented in BSIM3 with a temperature dependence: The following two diagrams show the effect of temperature dependent mobility on the transconductance of a large transistor.
c) Saturation of Carrier VelocityThe carrier velocity VSAT is reduced with increasing temperature as shown in the following equation and Figure 130:
d) Drain source resistanceThe temperature dependence of the drain source resistance is given by the following equation (see Figure 131):
e) Saturation Current of Drain/Source Bulk DiodesThe temperature dependence of the drain/source bulk diodes is given by the following equation for the saturation current density JS: The influence of XTI on diode current and saturation current density JS is shown below. |
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