Target Modeling
Target Modeling is a flexible IC-CAP toolkit that enables you to adjust a simulation model to definable targets. For example, you can use it to adjust a model to a new process or to view the overall trend of a production process.
In any semiconductor manufacturing environment, process data is monitored using process control monitors (PCM's). For example, those control monitors usually don't include device data from complete sweeps of gate voltages. Typically ID is measured at specific values of VG to get discrete pairs of VG/ID values. The goal is to use those targets to adjust a simulation model with extracted parameters from only a few wafers to the manufacturing process trend with a much larger number of measurements available through PCMs.
This toolkit enables you to:
| • |
Adjust a simulation model that was extracted on one die of a wafer to data that represents the overall trend of this process. |
| • |
Generate a simulation model for a new technology based on an existing model card plus a reduced set of characteristic data of this new technology. |
| • |
Perform comparisons between different simulated models and silicon data. |
| • |
Generate documentation containing measured data (PCM, Device Data) and the appropriate simulations. |
| • |
Easily add your own methods, model definitions, circuit definitions, and so on. |
|
