Manuals >Statistical Analysis >Getting Started Print version of this Book (PDF file) |
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Example—Building a Statistical ModelTo introduce IC-CAP Statistics, let's go through the typical steps needed to build a parametric statistical model, using parameters for a common semiconductor device model. We will:
The example we use to introduce IC-CAP Statistics is based on a parametric analysis, which assumes a Gaussian distribution of the data. IC-CAP Statistics also contains non-parametric analysis, which can be used when the data is bimodal or otherwise non-Gaussian. This method is described briefly at the end of this chapter and in depth in the Parametric Analysis Results Window.
Measure and Extract Model ParametersFirst you measure and extract the parameters needed for your device model using IC-CAP software or another parameter extraction program. This procedure is described in Chapter 5, "Making Measurements," in the User's Guide. The data is then imported into IC-CAP Statistics. Start IC-CAP Statistics and Import DataFrom the Main IC-CAP window choose the Tools drop-down menu and then choose Statistics (or click the Statistics icon). The Statistics package window is displayed.
There are four ways to begin working with IC-CAP Statistics:
For this overview, we will use the third method, and open an example file called bsim3.sdf.
This BSIM3 data file is being used to teach you how to use the program only. It does not contain validated data. Do not be concerned if you primarily use other types of models.
The spreadsheet displays the data in rows and columns. Each row contains one sample. Each column contains either a sample's attribute, such as the sample ID, lot number, date, or temperature; or is a sample's measured or extracted data, such as VSAT, VTH0, or TOX. Attribute information is displayed in blue, while parameter data is displayed in black. Spreadsheet FormatThe data may contain too many characters to fit in the cells. From the Format menu, choose Column Width, a dialog box appears. You enter a larger or smaller number in the field to fit your data. In this case, accept the default of 10 and choose OK. Transform DataOne of the key assumptions made by multivariate techniques such as Factor Analysis is that the data set to be analyzed is a joint Gaussian distribution. If the data is not joint Gaussian, then the model generated from the analysis may not accurately reproduce the measured density. One of the ways to help convert a data set to Gaussian is to perform a mathematical transformation. You have to decide which data columns need to be transformed. Some columns may already be Gaussian. As described below, you can quickly plot the data to see if it is Gaussian. The next step, Eliminate Outlier Data, can be done before the data transformation step, depending on the look of the data. Selecting Columns and RowsThe spreadsheet columns have the labels C1, C2, C3, etc., just above the columns. The rows have the labels R1, R2, R3, etc., just to the left of the rows. See Figure 1. To select an entire column or row, move the cursor to the column or row label you want and press the left mouse button. Plot and Analyze the DataTo view the data before transforming it, we will plot the data for column C8 as a histogram.
Transform the Data
Re-plot the histogram for column C8. Select column C8. From the Graph menu choose Histogram. Note that the data is now more Gaussian, but there is an outlier to the left.
Eliminate OutliersThere are several ways to eliminate outlier data or other invalid data. You can vary the order in which these methods are done. For example, you may immediately spot bad data and manually eliminate it, you can automatically filter the data to remove outliers, or you can plot the data in a histogram or scatter plot to help spot outliers. Often several iterations of these methods have to be performed until you're satisfied that the data is ready for correlation analysis. Plot and Analyze the DataTo help spot outlier data, let's study the latest plot, above, for column C8. Note the that there appears to be an outlier at the far left of the plot, corresponding to a value of about -6.9. If you scan the data in the column, you will see that this value is in row R20. Manually Eliminate OutliersLet's assume that from a review of the data, you believe the sample in row R20 is a bad sample.
Automatic Data FilteringIC-CAP Statistics can automatically filter data based on minimum/maximum values or by a scale value. We will use a scale value. Scale is defined as the median absolute deviation (MAD) divided by a constant (approximately 0.6745). This standardizes MAD in order to make the scale estimate consistent with the standard deviation of a normal distribution. The greater the scale value, the further from the median the filtering occurs.
Choose Statistical Summary for a Numeric DisplayBesides a variety of plots to help you analyze your data, IC-CAP Statistics also has a Statistical Summary window (Analysis > Statistical Summary), which shows you standard statistical data, such as mean, variance, standard deviation, skewness, kurtosis, etc. Repeat Data Transformation and Outlier Elimination for Other ColumnsRepeat the steps outlined in the last two sections for each column that is non-Gaussian. For this example, you can skip this step. Perform Correlation AnalysisCorrelation analysis provides a numerical measure of the amount of variation in one variable that is attributable to another variable. When an increase in the value of one variable is associated with an increase in the value of the other variable, the correlation is positive. When the increase is associated with a decrease, the correlation is negative. Correlation analysis is always performed before proceeding to factor analysis and the data used consists of all the rows in the spreadsheet that have not been filtered, deactivated, or deleted. To perform correlation analysis: From the Analysis menu, choose Correlation Analysis. The Statistics window changes so that the Correlation Matrix folder is displayed. (If you want to go back to the parameter data before correlation analysis was performed, choose the folder tab labeled Parameters.) The Correlation Matrix displays the same parameters down the rows and across the columns. The correlation coefficients for any two parameters are displayed where the rows and columns intersect. In the above example, the cell formed by R4 and C2 has a value of about 0.69, which shows moderate to strong correlation between parameters TOX and VTH0. Perform Factor AnalysisNow that the correlation matrix is defined, the next step is to perform factor analysis.
The top portion of the Factor Loading folder displays the data in a color-coded format. Factor Group data, one group per row, is displayed in a red font. Dominant Parameter data, one dominant parameter per column, is displayed with a blue background. A detailed description of both can be found in Perform Factor Analysis. Generate EquationsNext, we will generate equations from the factor analysis. You can generate equations from factors or dominant parameters. IC-CAP Statistics computes the equation coefficients that you use to build your SPICE model. From the Analysis menu choose Generate Equations. A submenu with two choices appears to the right. Choose Factors. The screen changes to display the Equations folder Generate a Parametric ModelNow that the equation coefficients are generated, you can build a variety of statistical models, or save the data in a SPICE equations format for use in circuit simulations. You can choose from Monte Carlo, Corner, or Parametric Boundary models. You can test your model, based on a reduced set of parameters, against the raw data to see how well it performs. At this point, IC-CAP Statistics has been designed for flexibility to work with your process. For our example, we will perform Monte Carlo analysis and compare the results to the raw data. Perform Monte Carlo Analysis, Plot Data, and Compare
Details on Corner Models and Boundary Models are found in Generate a Parametric Model. Non-Parametric Boundary ModelingIC-CAP Statistics contains proprietary Agilent EEsof non-parametric analysis algorithms for identifying nominal models and worst-case-candidate models from arbitrary joint probability densities. This advanced feature, called Non-Parametric Boundary Modeling, differs from the parametric (joint Gaussian) methods described earlier, and can be used when the data is bimodal or otherwise non-Gaussian. Details on Non-Parametric Boundary Modeling are found in Parametric Analysis Results Window. |
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