Manuals >Nonlinear Device Models Volume 1 >1/f Noise Extraction Toolkit Print version of this Book (PDF file) |
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Measure NoiseStart > Measure NoiseThe diagram below shows the general setup for noise measurement.
Clicking on Measure Noise on the Start Wizard window launches the Measure Noise Data window shown below. This half of the dialog box is captioned Noise Measurements (All Points). It is used to make automatic measurements of a number of DC bias points. This number is determined by the product of the number of Ib points swept and the number of Vc points swept. This is typically 10 to 20—in this example 15. Within this box is the Noise Bias SMU Settings box. You use this to set the start and stop values of Ib and Vc, and the step sizes. From this data, the number of points in each range is calculated and displayed, and also the total number of Noise Bias Points.
The Noise Points MUST be a subset of the points measured in the Verify DC setup.
In the Measurement Control box the Measure All button is used to start the automatic measurement. The Clear All button is simply a convenience in starting a new measurement setup. The Instrument Options box contains only the DSA Number of Averages value. This is typically between 50 and 100. The button titled Display Plot only displays noise measurements at constant Vc. Individual Noise Measurements at constant VcThe box captioned Noise Measurements at constant Vc is used to make noise measurements at constant Vc only. The bias conditions are chosen from the set defined in the All Points window to the left. Use the Choose Vc dropdown list to select the value.
When selecting a Vc value, the previously measured noise points at other Vc values are skipped during this measurement, and the past measurement data are left unchanged in the repository.
Use the Measure button to start the measurement. It will launch a window titled Measure Single Noise Point Setup shown in the next figure. This dialog gives you guidance and a checklist for completing the single point measurement. The top box titled Now Measuring gives the bias point sequence number, and the Vc an Ib bias conditions. The next four boxes let you check and launch the measurement.
Before proceeding to the next step, make sure that the input filter has had enough time to be fully charged so that the device is biased at the chosen operating point.
Start > Extract > Select VcClicking on Extract in the Start Wizard window launches the Extract Noise Parameters window shown below. The DC Bias Overview shows the DC setting used for the noise measurement. The user is not allowed to change this table since the noise bias point were set before the Noise Measurements and the noise have been measured already. Click on the Select Vc tab. Select the Vc value at which you want to perform the extraction. A noise data plot at the selected Vc will be displayed automatically, as shown below. Extraction of noise parameters Af and KfStart > Extract > Select Frequency
Choose a frequency range where the traces are flat, i.e show an ideal 1/f behavior.
The calculated noise sample uses equation (1) for bipolar or (3) for MOS. The calculated noise is only valid in the 1/f noise region.
Buttons on Left Side of Dialog Box
Start > SimulateClicking on SImulate in the Start Wizard window launches the Simulate Noise window shown below.
The simulation dialog has three main areas:
The Tune Noise Parameters boxIn order to simulate noise values it is necessary to have values of Af and Kf that are a good fit over the measured range of data. This is done by setting their maximum and minimum values - in this example 2.0 and 0.5 for Af, and 1f and 0.01f for Kf. The actual values used are controlled by the slider. In the noise_vs_frequency plot, shown below, the yellow simulated (calculated) curves yellow respond to the slider-selected value of Af, and match the red (measured) data curves best with Af at 979.4m. This "eye-balling" method of curve-fitting works quickly and well.
The simulation is performed using the selected Vc, change Vc and re-simulate to see how the extracted parameters fit the other Vc values.
Buttons on the Left Side of the Dialog:
Start > Data ManagerClicking on Data Manager in the Start Wizard window launches the Data Manager Dialog window shown below. The Data Manager Dialog has three tabbed folders, titled:
The dialog presents two choices:
Selecting Attach Noise and DC Data setups... allows you to save the noise and DC measurement data to a model. The model must be opened with its icon in the IC-CAP main window. This option may be useful when you want to keep all the measurement data (electrical, noise, etc.) in the same model file. Selecting Save Noise and DC Data to different MDM files Noise and DC data are saved in the specified MDM files. Important Note: Along with the DC and Noise Data, IC-CAP also saves to a DUT or the MDM files some key setting variables and the extracted noise parameters. IC-CAP saves the following variables:
Start > Data Manager > Load DataClick on the Load Data folder. Select Read Noise and DC Data from an opened model to read noise and DC measurement data from a model. The model must be opened and located in the IC-CAP main window. Selecting Read reads DC and Noise measurement data from the DUT to the repository's setups.
Bias settings for DC and Noise measurements will be changed according to the settings stored in the DUT. Actual DC and Noise bias settings, extracted values, and LNA sensitivity settings will be lost and replaced by the values saved in the DUT.
Select Read Noise and DC Data from MDM files to save Noise and DC data to the specified MDM files.
Bias settings for DC and Noise measurements will be changed according to the settings in the MDM files. Actual DC and Noise bias settings, extracted values and LNA sensitivity settings will be lost and replaced by the values saved in the MDM files.
Start > Data Manager > Report DataReport Data tab folder.Select Generate Report to write a text report to the specified file name. To change the report format see transform Gui Driver/Data Manager/Generate Text. |
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