Manuals >Nonlinear Device Models Volume 1 >HiSIM2 and HiSIM_HV Characterization
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References

  1   HiSIM Web Site: http://home.hiroshima-u.ac.jp/usdl/HiSIM.html

  2   H.J.Mattausch et al., "Accuracy and Speed Performance of HiSIM Versions 231 and 240", Compact Modeling for CMOS/Nano Technologies, MOS-AK / ESSDERC / ESSCIRC Workshop, Munich, Germany, September 14th, 2007

  3   M.Miura-Mattausch et al.: "HiSIM: Self-Consistent Surface- Potential MOS-Model Valid Down to Sub-100nm Technologies", Technical Proceedings of the 2002 International Conference on Modeling and Simulation of Microsystems, Vol.1 (Nanotech 2002), P. 678 - 681, NSTI Nano Science and Technology Institute 2002, Cambridge, Massachusetts, USA; also to be found at: http://www.nsti.org/procs/MSM2002/13/T41.03


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