Manuals >Reference >IC-CAP Functions Print version of this Book (PDF file) |
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MM9_COPYCopies an input array to a measured or simulated output dataset. MM9_DATAEnables printing of the data measured for quick extraction. If no argument is supplied, the data will be printed to the Status window; if a filename is supplied, the data will be appended to that file. MM9_GEOMPARUpdates the simulated values of the miniset parameters in the setups extract/par_vs_L, extract/par_vs_W and extract/par_vs_R in the MOS Model 9. MM9_GEOMSCALDetermines a first guess for the maxiset parameters of a MOS Model 9 by regression. MM9_KEEPAccepts an input array and copies it directly to the transform output. MM9_LIN_EXTExtracts the linear region parameters for the MOS Model 9. MM9_SAT_EXTExtracts the saturation region parameters for the MOS Model 9. MM9_SAVE_SPARSSaves the MOS Model 9 parameters of a single device (miniset) to a file. MM9_SETUPAllows you to specify the setups for the MOS Model 9 parameter extraction. MM9_STH_EXTExtracts the subthreshold region parameters for the MOS Model 9. MM9_TEMPPARUpdates the simulated values of the miniset parameters in the setups extract/par_vs_T in the MOS Model 9. MM9_TEMPSCALDetermines a first guess for the maxiset temperature parameters of a MOS Model 9 by regression. MM9_WEAVAL_EXTExtracts the weak avalanche region (substrate current) parameters for the MOS Model 9. MOS_process_parsAllows you to specify initial values for the MOS process related parameters LD, RS, RSH, TOX, WD, and XJ. The drain resistance RD is set equal to the specified value of RS.
Lateral Diffusion, Source Resistance, Sheet Resistance, Oxide Thickness, Width Reduction, Junction Depth
MOSCV_total_capExtracts the total PN junction capacitance parameters from the bottom and sidewall. Requires C-V measurement on 2 different geometries. The first measurement should be on a device in which the bottom capacitance dominates. The second measurement should be on a device in which the sidewall capacitance dominates. MOSCVmodCBDCalculates the Bulk-Drain junction capacitance according to the UCB MOS model. MOSCVmodCBSCalculates the Bulk-Source junction capacitance according to the UCB MOS model. MOSDC_lev2_lin_largeStandard extraction for the UCB MOS model. Extracts classical Level 2 parameters, using Id versus Vg data from a large device. Initializes the parameter NFS for later optimization. MOSDC_lev2_lin_narrowStandard extraction for the UCB MOS model. Extracts Level 2 width parameters, using Id versus Vg data from a narrow device. MOSDC_lev2_lin_shortStandard extraction for the UCB MOS model. Extracts Level 2 length effect parameters, using Id versus Vg data from a short-channel device. MOSDC_lev2_sat_shortStandard extraction for the UCB MOS model. Extracts Level 2 saturation parameters, using Id versus Vd data from a short-channel device. MOSDC_lev3_lin_largeStandard extraction for the UCB MOS Level 3 model. Extracts classical Level 3 parameters, using Id versus Vg data from a large device. Initializes the parameter NFS for later optimization. MOSDC_lev3_lin_narrowStandard extraction for the UCB MOS Level 3 model. Extracts Level 3 width parameters, using Id versus Vg data from a narrow device. MOSDC_lev3_lin_shortStandard extraction for the UCB MOS Level 3 model. Extracts Level 3 length effect parameters, using Id versus Vg data from a short device. MOSDC_lev3_sat_shortStandard extraction for the UCB MOS Level 3 model. Extracts Level 3 saturation parameters, using Id versus Vd data from a short device. MOSDC_lev6_lin_largeStandard extraction for the HSPICE MOS Level 6 model. Extracts classical Level 6 parameters, using Id versus Vg data from a large device. Initializes the parameter NFS for later optimization. MOSDC_lev6_lin_narrowStandard extraction for the HSPICE MOS Level 6 model. Extracts Level 6 width parameters, using Id versus Vg data from a narrow device. MOSDC_lev6_lin_shortStandard extraction for the HSPICE MOS Level 6 model. Extracts Level 6 length effect parameters, using Id versus Vg data from a short device. MOSmodelSimple, level 1 UCB MOS model. Calculates Id from voltages. MOSmodel2Complete UCB MOS model, containing levels 1, 2, and 3. Calculates Id from voltages. MXT_cbcThis function calculates the total base-collector depletion capacitance Cbc vs. bias given vbc. See Philips Report NL-UR 2001/801, section 2.5.2 for more details. MXT_cbeThis function calculates the total base-emitter depletion capacitance Cbe vs. bias given vbe. See Philips Report NL-UR 2001/801, section 2.5.1 for more details. MXT_cj0This function extracts the zero-bias junction capacitance, Cje0, Cjc0 or Cjs0 depending on which Output mode is selected: E/C/S. The total bias range needs to include V = 0 V, but it is not necessary that one of the Vj value is indeed zero. See Philips Report NL-UR 2001/801, sections 2.5.1-2.5.3 for more details. MXT_cscThis function calculates the total substrate-collector depletion capacitance Csc vs. bias given vsc. See Philips Report NL-UR 2001/801, section 2.5.3 for more details. MXT_forward_hfeThis function calculates hfe given veb,vcb and ic.m. When the MODEL variable MXT_AUTO_RANGE is set to the value 1.0 the transform will use the measured collector current to determine the upper limit for extracting the parameters: BF, IBF and MLF. This limit is determined by the onset of high-injection. The function is used in the dc_gummel/Forward setup to extract the non ideal base current parameters IBF, MLF and the forward current gain BF. See Philips Report NL-UR 2001/801, section 2.5.8 for more details. MXT_forward_icThis function calculates ic given veb and vcb. When the MODEL variable MXT_AUTO_RANGE is set to the value 1.0 this transform will also require ic.m as an input. The transform uses the measured collector current to determine the upper limit for extracting the parameter: IS. This limit is set by the onset of high-injection. The function is used to extract IS in the setup dc_gummel/Forward.
collector-base voltage (this should be constant in a forward gummel plot )
calculated ideal forward collector current (DO NOT include series resistances, high injection, quasi-sat etc.)
See Philips Report NL-UR 2001/801, section 2.5.7 for more details. MXT_forward_vbeThis function calculates vbe given vcb, ic.m and ib.m. When the MODEL variable MXT_AUTO_RANGE is set to the value 1.0, the transform will also require veb (ve-vb) as an input. The transform is used to optimize RE in the setup dc_gummel/Forward. See Philips Report NL-UR 2001/801, section 2.5.9 for more details. MXT_ftThis function calculates the cut-off frequency fT as a function of Ic, Vbe and Vce. The function is used to extract the transit time parameters as well as several other high current parameters. See Philips Report NL-UR 2001/801, section 2.6 for more details. MXT_hard_sat_isubThis function calculates the substrate current in hard saturation. It is used in the dedicated setup dc_paras/Rc_active to extract the parameter RCC. See Philips Report NL-UR 2001/801, section 2.5.10 for more details. MXT_ic_vceThis function calculates the collector current or the base emitter voltage (depending on the selected Output) as function of the voltage difference Vce and the base current Ib. Ic is used to correct for series resistances. Vbe and Is are used for setting initial values in the calculation and for auto-ranging.
Auto-ranging is always ON for this function, regardless of the value of the variable MXT_AUTO_RANGE.
The function is used to extract the model variable RTH (thermal resistance) and several other parameters in combination with the MXT_ft transform. RTH along with Ic and Vce are used to calculate a new simulation temperature. To remove RTH's influence on the simulation temperature, set RTH to zero. See Philips Report NL-UR 2001/801, section 2.6 for more details. MXT_I0This function extracts either IE0, IC0, or IB0 depending on which Output mode is selected: E/C/B. The function requires a terminal current as input. This transform uses the array of current data Idata and takes the first value at index 0. The I0 value can be used in the forward-Early and reverse-Early measurements to get a first estimate of the current offset. The subsequent optimizations, which require either IE0, IB0 or IC0, provide more robust results. Sometimes the optimizer will have trouble converging to a proper solution if these currents are too far from their final values. See Philips Report NL-UR 2001/801, section 2.5.4-2.5.6 for more details. MXT_jun_capThis function calculates Cbe, Cbc, or Csc vs junction voltage given vbe, vbc, or vsc. This function combines the functionalities of the 3 functions: MXT_cbe, MXT_cbc, MXT_csc.
Code to indicate which junction to calculate MXT_reverse_currentsSelecting Output=B calculates ib given vbc, vbe and ie. When the MODEL variable MXT_AUTO_RANGE is set to the value 1.0, the transform will use the measured emitter current to determine the lower limit for extracting the parameters: XEXT and IKS. This limit is set by the onset of high-injection. Selecting Output=S calculates is given vbc, vbe and ie. When the MODEL variable MXT_AUTO_RANGE is set to the value 1.0, the transform will use the measured emitter current to determine the lower limit for extracting the parameters: XEXT and IKS. This limit is set by the onset of high-injection. Selecting Output=E calculates ie given vbc, vbe and ie. When the MODEL variable MXT_AUTO_RANGE is set to the value 1.0, the transform will use the measured emitter current to determine the lower limit for extracting the parameters: XEXT and IKS. This limit is set by the onset of high-injection.
select: See Philips Report NL-UR 2001/801, section 2.6.7 for more details. MXT_reverse_hfcThis function calculates HFC (ie/ib) given veb, vcb and ie.m. When the MODEL variable MXT_AUTO_RANGE is set to the value 1.0, the transform uses the measured emitter current to determine the upper limit for extracting the parameter BR, IBR, VLR. This limit is set by the onset of high-injection. This transform has an additional input: substrate (y/n). This is used to calculate the reverse beta with or without the addition of the substrate current.
calculated reverse current gain See Philips Report NL-UR 2001/801, section 2.5.12 for more details. MXT_reverse_hfc_subThis function calculates the substrate to emitter current gain: HFCsub (-ie/is) given veb and vcb. The function is used in the setup dc_gummel/Reverse to extract the parameter ISS. When the MODEL variable MXT_AUTO_RANGE is set to the value 1.0, the transform will require 2 additional inputs: emitter and substrate currents (ie) & (is). The transform uses the measured emitter & substrate currents to determine the upper limit for extracting the parameter ISS. This limit is set by the onset of high-injection in both the emitter and substrate currents. See Philips Report NL-UR 2001/801, section 2.5.11 for more details. MXT_reverse_isubThis function calculates the substrate current for low reverse conditions. It can be used to extract the parameter ISS, however Philips recommends another method (see section 2.5.11).
base-collector voltage (positive as transistor reverse biased)
calculated substrate current Isub = ISS*(exp(Bbc/VT)-1) where VT is the thermal voltage.
See Philips Report NL-UR 2001/801, section 2.5.11 for more details. MXT_show_parmsThis function prints all the Mextram parameters at the actual ambient temperature set by the variable TEMP. The functions will use these parameters in their calculations. See Philips Report NL-UR 2001/801, section 5.1.1 for more details. mxt_smoothThis function performs a smoothing function on the data.
number of points on either side of data point to be use for smoothing.
number of iterations that smoothing algorithm is performed on data. MXT_veaf_ibThis function calculates the base current in a forward early measurement. It is used in the setup dc_early_avl/Fwd_early to extract the avalanche parameters VAVL and WAVL. See Philips Report NL-UR 2001/801, section 2.5.4 for more details. MXT_veaf_icThis function calculates forward current ic given vcb, veb and the model variable IC0. When the MODEL variable MXT_AUTO_RANGE is set to the value 1.0, the transform will require one additional input: base current ib. The transform uses the measured base current to determine the onset of weak avalanche breakdown. This sets the upper limit of the optimization, opt_Veaf. See Philips Report NL-UR 2001/801, section 2.5.6 for more details. MXT_vear_ieThis function calculates ie when the base emitter junction is reversed biased, and the base collector junction is forward biased. Vcb is assumed to be constant. The function is used in the setup dc_early_avl/Rev_early to extract the parameter VER. See Philips Report NL-UR 2001/801, section 2.5.5 for more details. MXT_VEFThis function calculates a starting value for the parameter VEF. The Model Parameter list is updated and the extracted value is printed in the status window. To extract VEF, run this transform first and then optimization opt_VEF in the setup dc_early_avl/Fwd_early. See Philips Report NL-UR 2001/801, section 2.5.6 for more details. MXT_VERThis function calculates a starting value for the parameter VER. The Model Parameter list is updated and the extracted value is printed in the status window. To extract VER, run this transform first and then optimization opt_VER in the setup dc_early_avl/Rev_early. See Philips Report NL-UR 2001/801, section 2.5.5 for more details. mxt3t_cbcThis function calculates Cbc verses base collector junction voltage. mxt3t_cbeThis function calculates Cbe verses base emitter junction voltage. mxt3t_cj0This function extracts the zero-bias junction capacitance, Cje0, or Cjc0 depending on which Output mode is selected: E/C/S. |
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