References

1	"Simulating Noise in Nonlinear Circuits Using the HP Microwave and Design System". Agilent Product Note 85150-4,1993. http://www.agilent.com

2	IC-CAP Noise Modeling Workshop. Agilent Technologies, Germany and Technical University of Munich, Institute of High Frequency Techniques. Munich, Germany 1998.

3	F. X. Sinnesbichler, M. Fisher, G. R. Olbrich, "Accurate Extraction Method for 1/f Noise Parameters

4	Used in G-P Type Bipolar Junction Transistor Models". IEEE MTT-S Symposium, Baltimore, 1998.

5	C. G. Jakobson, I. Bloom, Y. Nemirovsky. "1/f Noise in CMOS Transistors for Analog Applications". 19. Convention of Electrical and Electronics Engineers in Israel, 1996. pp. 557-560.

6	Private communication: G. Knoblinger, Infineon AG, Munich and F. Sischka.

7	A. Blaum, O. Pilloud, G. Scalea, J. Victory, F. Sischka. "A New Robust On-Wafer 1/f Noise Measurement and Characterization System". To be published: ICMTS Conference 2001, Kobe, Japan.

8	Stanford Research SR570 Low-Noise Current Preamplifier.

See http://www.srsys.com

9	A. Van Der Ziel. "Noise, Sources, Characterization, Measurement", Prentice Hall, 1970.