Test Instruments

The HP 4141, Agilent 4142, HP 4145, Agilent 4155, or Agilent 4156 can be used to derive DC model parameters from measured DC voltage and current characteristics.

The Agilent 8510, Agilent 8753, or HP 8702 (with an HP 41xx instrument) can be used to derive capacitance and inductance model parameters from S-parameter measurements.

Instrument-to-Device Connections

When the device is installed in a test fixture, verify the correct connection of device nodes by checking the specifications in the setup tables. The following table is a cross-reference of the connections between the terminals of a typical MESFET device and various measurement units. These connections and measurement units are defined in the UCBGaas.mdl example file.

Input and output tables in the various setups use abbreviations D (drain), G (gate), and S (source) for the MESFET device nodes. These nodes are defined in the Circuit folder.

Measurement units (abbreviated as follows) are defined in Hardware Setup.

SMU# for DC measurement units
NWA for network analyzer units

Table 86 Instrument-to-Device Connections

DUT	Source	Gate	Drain	Comments
dc	SMU3	SMU2	SMU1
ac	Ground	SMU2 NWA (port 1)	SMU1 NWA (port 2)	Calibrate for reference plane
Notes: 1. DUT is the name of the DUT as specified in DUT-Setup. 2. Example: DUT dc has the DC measurement unit SMU1 connected to its drain, SMU2 connected to its gate, and SMU3 connected to its source.