Test Instruments

The HP 4141, HP/Agilent 4142, or HP 4145 can be used to derive DC model parameters from measured DC voltage and current characteristics.

The HP 4271, HP 4275, HP 4280, HP/Agilent 4284, or HP 4194 can be used to derive capacitance model parameters from measured capacitance characteristics at the device junctions.

Instrument-to-Device Connections

When the device is installed in a test fixture, verify the correct connection of device nodes by checking the inputs and outputs for the appropriate DUTs. The following table is a cross-reference of the connections between the terminals of a typical bipolar transistor and various measurement units. These connections and measurement units are defined in the model file.

Table 83 Instrument-to-Device Connections 

DUT	Collector	Base	Emitter	Substrate	Comments
dc	SMU1	SMU2	SMU3	SMU4
cbe	open	CM(H)	CM(L)	open	calibrate for stray capacitance
cbc	CM(L)	CM(H)	open	open	calibrate for stray capacitance
ccs	CM(H)	open	open	CM(L)	calibrate for stray capacitance
prdc	SMU1	SMU2	SMU3	SMU4
ac	NWA (Port2) and SMU1	NWA (Port1) and SMU2	ground	SMU4	calibrate for reference plane
Notes: 1. DUT is the name of the DUT as specified in DUT-Setup. 2. To read the table: dc has the dc measurement unit SMU1 connected to its collector, SMU2 connected to its base, SMU3 connected to its emitter, and SMU4 connected to its substrate.

Input and output tables in the various setups use abbreviations C (collector), B (base), E (emitter), and S (substrate) for the bipolar transistor nodes. These nodes are defined in the Circuit folder.

Measurement units (abbreviated as follows) are defined in Hardware Setup.

SMU# for DC measurement units

VM# for voltage monitor units

VS# for voltage source units

CM for capacitance measurement units

NWA for network analyzer port units