Test Equipment

This section lists the test equipment and software available in the UBC VLSI Lab. The test equipment consists of the following items:

• HP VXI Test System
• CMC TH1000 Mixed-Signal IC Test Head
• HP 700i UNIX Workstation
• IMS Logic Master XL Model 60 Digital Test System

Physical testing of digital ICs involves the following:

• functional testing
• structural testing
• timing measurements
• DC parametric measurements

Functional testing involves testing the device to ensure that the internal logic does what it was designed to do. Structural testing finds stuck-at-faults in the device. Timing measurements are used to determine the reliable AC operating regions of the device dealing with parameters such as hold and setup times. DC parametric measurements measure the external load the device can handle.

The HP VXI Test System, along with the CMC Test Head, can be used to perform functional and structural testing of digital ICs. The HP VXI Test System can also perform physical tests of analog ICs. The IMS XL60 can be used to perform functional and structural testing, timing measurements and DC parametric mesurements. However, at this time, the IMS tester is not operational and will not be discussed.

The HP 700i UNIX Workstation runs the software that is needed to control both the HP VXI System and the CMC Test Head. The two software packages are the following:

• HP VEE Test
• HP1496A Test Development Software

Both HP VEE Test and the HP Test Development Software will be described in later sections. The next two sections describe the HP VXI Test System and the CMC Test Head respectively.