[Journal Papers]

  1. Baosheng Wang, Josh Yang, Yuejian Wu, André Ivanov and Yervant Zorian, "A Time-Efficient Customizable March Test Algorithm for Embedded SRAM", submitted to IEEE Transactions on Computers

  2. Josh Yang, Baosheng Wang, Yuejian Wu and André Ivanov, “Fast Detection of Data Retention Faults and Other SRAM Cell Open Defects", IEEE Transactions on Computer Aided Design (TCAD) of of Integrated Circuits and Systems, Vol. 25, No. 1, Jan. 2006, pp. 167-180

  3. Baosheng Wang, Andy Kuo, Touraj Farahmand, Yong B. Cho, Sassan Tabatabaei, and André Ivanov, “A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices”, Journal of Electronic Testing Theory and Applications (JETTA), Vol. 26, No. 6, Dec. 2005, pp. 621-630

  4. Changsong Shen, Baosheng Wang, Steve Oldridge, Florian Vogt and Sidney Fels, “RemoteEyes: A Remote Low-Cost Position Sensing Infrastructure for Ubiquitous Computing”, the special issue on INSS2004 of Transaction of SICE Vol.E. SICE, the Society of Instrument and Control Engineers

  5. Xu Feng, Wang Zhifang, Wang Baosheng, “Research on AR model applied to forecast trend of vibration signals”, Journal of Tsinghua University Science and Technology, Vol. 39, No. 4, 1999

[Conference Papers]

  1. Baosheng Wang, Josh Yang and André Ivanov, “On the Reduction of Test Time of Embedded SRAMs”, the 2003 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT2003), pp. 47-52, July 28-29, 2003

  2. Baosheng Wang, Yong B. Cho, Sassan Tabatabaei, and André Ivanov, “Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-offs for High-Speed Interconnect Device Testing”, the 12th Asian Test Symposium (ATS'2003), pp. 348 – 353, Nov. 16-19, 2003

  3. Josh Yang, Baosheng Wang and André Ivanov, “Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode”, Proceedings of the 17th International Conference on VLSI Design, pp. 493 – 498, January 5-9, 2004

  4. Baosheng Wang, Josh Yang, James Cicalo, André Ivanov and Yervant Zorian, “Reducing Embedded SRAM Test Time under Redundancy Constraints”, Proceedings of the 22nd IEEE VLSI Test Symposium (VTS04), pp. 237-242, Apr. 25-29, 2004

  5. Changsong Shen, Baosheng Wang, Steve Oldridge, Florian Vogt and Sidney Fels, “RemoteEyes: A Remote Low-Cost Position Sensing Infrastructure for Ubiquitous Computing”, Proceedings of the First International Workshop on Networked Sensing Systems (INSS2004), pp. 31-35, June 22 –23, Tokyo, Japan

  6. Baosheng Wang, Yuejian Wu and André Ivanov, “Designs for Reducing Test Time of Distributed Small Embedded SRAMs”, IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), pp. 120-128, Oct. 10-13, 2004

  7. Baosheng Wang and André Ivanov, “Time-Driven Embedded SRAM Testing Methodologies”, in the Asia and South Pacific Design Automation Conference 2005 (ASP-DAC), PhD Forum, Shanghai, China, Jan. 18-21, 2005

  8. Baosheng Wang, Josh Yang, Yuejian Wu and André Ivanov, “A Retention-Aware Test Power Model for Embedded SRAM”, in the Asia and South Pacific Design Automation Conference 2005 (ASP-DAC), pp. 1180-1183, Jan. 18-21, 2005

  9. Baosheng Wang, Derek Ho, Samad Sheikhaei and André Ivanov, “An Embedded Clock Infrastructure for SoC Path Delay Characterization”, in the Second IEEE Workshop on Infrastructure IP (I-IP), pp. 9-12, Charlotte, NC, USA, Oct. 28 –29, 2004

  10. Baosheng Wang, Yuejian Wu and André Ivanov, “A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs”, in the Design Automation and Test in Europe (DATE 2005), pp. 852-857, Mar 7-11, 2005

  11. Baosheng Wang, Yuejian Wu, Josh Yang, André Ivanov and Yervant Zorian, "SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms", to appear in the 23rd IEEE VLSI Test Symposium (VTS05), Rancho Mirage, Palm Springs, CA, USA, May 1st - May 5th, 2005

  12. Cristian Grecu, Partha Pratim Pande, Baosheng Wang, André Ivanov, "Methodologies and Algorithms for testing Switch-based NoC Interconnects", Proceedings of  IEEE International Workshop on Infrastructure IP (I-IP), May 4-5 2005, Palm Springs, California

  13. Cristian Grecu, Partha Pratim Pande, Baosheng Wang, André Ivanov, Res Saleh, "Methodologies and Algorithms for Testing Switch-Based NoC Interconnects", to appear in the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2005), 3-5th October, 2005, Monterey, USA

  14. Qiang Xu, Baosheng Wang and F. Y. Young, "Retention-Aware Test Scheduling for BISTed Embedded SRAMs", to appear in the IEEE European Test Symposium (ETS), Southampton, UK, May 2006

  15. Baosheng Wang and Qiang Xu, "Test/Repair Area Overhead Reduction for Small Embedded SRAMs", submitted to International Test Conference (ITC), Santa Clara, Ca, USA, 2006

[Patents]

  1. Baosheng Wang, Josh Yang and André Ivanov, "Method and Apparatus for Testing Memory Cells for the Open Defect(s)", US patent in application

[Presentations]

 

  1. Baosheng Wang, Josh Yang and André Ivanov, “Reducing Test Time of Embedded SRAMs”, Presented in the 2003 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT2003) on July 28, 2003

  1. Baosheng Wang, Yong B. Cho, Sassan Tabatabaei, and André Ivanov, “Trade-offs among Yield, Overall Test Environment Timing Accuracy, and Defect Level for High-Speed Interconnect Device Testing”, Presented in the 12th Asian Test Symposium (ATS'2003) on Nov. 18, 2003

  1. Josh Yang, Baosheng Wang and André Ivanov, “Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode”, Presented in the 17th International Conference on VLSI Design on Jan. 8, 2004

  1. Baosheng Wang, Josh Yang, James Cicalo, André Ivanov and Yervant Zorian, “Reducing Embedded SRAM Test Time under Redundancy Constraints”, Presented in the 22nd IEEE VLSI Test Symposium on Apr. 27, 2004

  1. Baosheng Wang, Yuejian Wu and André Ivanov, “Designs for Reducing Test Time of Distributed Small Embedded SRAMs”, Presented in the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04) on Oct. 11, 2004

  1. Baosheng Wang, Derek Ho, Samad Sheikhaei and André Ivanov, “An Embedded Clock Infrastructure for SoC Path Delay Characterization”, Presented in the Second IEEE Workshop on Infrastructure IP (I-IP) on Oct. 28, 2004
  2. Baosheng Wang, Yuejian Wu and André Ivanov, “A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs”, Presented in the Design Automation and Test in Europe (DATE 2005) on March 9, 2005
  3. Baosheng Wang, "DFX Solutions for System on-a-Chip", Presented at Intel@Oregon, on April 15, 2005
  4. Baosheng Wang, "Accelerated Retention Test for SRAMs", Presented at Intel@Oregon, on May 13, 2005

   

[Posters]

  1. Baosheng Wang, Zion Kwok, Florian Vogt, Sidney Fels, “Distributed Embedded Video Processing System, A Research Platform for Multi-Camera Applications”, Presented at the IS 2003: 13th Annual Canadian Conference on Intelligent Systems on June 8-10, 2003 in Halifax, Nova Scotia, Canada.

  1. Baosheng Wang, Josh Yang and André Ivanov, “Embedded SRAM Cost Reduction at an Early Design Stage”, Presented at the 17th International Conference on VLSI Design on Jan. 9, 2004

  1. Changsong Shen, Baosheng Wang, Steve Oldridge, Florian Vogt and Sidney Fels, “RemoteEyes: A Remote Low-Cost Position Sensing Infrastructure for Ubiquitous Computing”, Presented at the IS 2004: 14th Annual Canadian Conference on Intelligent Systems on June 6 - 8, 2004 - Westin Hotel, Ottawa, Ontario, Canada

  2. Baosheng Wang, Josh Yang, Yuejian Wu and André Ivanov, “A Retention-Aware Test Power Model for Embedded SRAM”, presented in the Asia and South Pacific Design Automation Conference 2005 (ASP-DAC), Shanghai, China, on Jan. 20, 2005

  3. Baosheng Wang and André Ivanov, “Time-Driven Embedded SRAM Testing Methodologies”, to appear in the Asia and South Pacific Design Automation Conference 2005 (ASP-DAC), PhD Forum, Shanghai, China, on Jan. 20, 2005